2022/02/14 (Monday)
- Lab in-personnel: Matt
| Status | Run 75 in progress |
|---|---|
| Setup | Tower Faces 5/3/2 → Cables 2/1/3 → nothing/diverter_board+extra_board/nothing → Side2-readout HVboard CONN1/2/3 → HV1/2 → DCRC55(1)/50(3) Lead shield in place. Am Source y = 0.03 mm |
| Testing Side2-readout HV board | |
| 0855 | Goldman/Tower/MC(H35)/Coldplate = 42.5/104/33.3/175 mK, Still = 1.28 K / 0.110 mbar / 0 mW, G1/G2= 267/239 mbar, 1K Pot = 1.59 K / 11±1 mbar, MB = 70.6% |
| 0950 | Fill LN2 cold trap bath |
| 1000 | Pulses all look OK but temperature is elevated, currently Goldman = 43.0 mK. |
| 1005 | Zap SQUIDs on DCRCs1&3 |
| 1150 | Goldman = 42.2 mK |
| 1155 | Mini-IbIs on DCRC1pA, adjust QET bias for dP/dI = 0.7 uV |
| 1210 | Mini-IbIs on DCRC1pB, adjust QET bias for dP/dI = 0.7 uV. Here QET bias is a lot higher than expected. |
| 1215 | Mini-IbIs on DCRC1pD, adjust QET bias for dP/dI = 0.7 uV. Also here QET bias is higher than expected. |
| 1225 | Mini-IbIs on DCRC3pA, adjust QET bias for dP/dI = 0.7 uV. |
| 1235 | Mini-IbIs on DCRC3pB, adjust QET bias for dP/dI = 0.7 uV. |
| 1240 | Mini-IbIs on DCRC3pD, adjust QET bias for dP/dI = 0.7 uV. |
| 1242 | Dial HV up to 113.0 V using RootSequencer for prebias |
| 1245 | Adjust driver offset so set baselines near -0.9 V. |
| 1248 | After 5 minutes dial HV down to 98.5 V |
| 1250 | Start 98.46 V data series after 5 min 15% prebias, 43 min long, with 1000 initial randoms, 5 Hz in-run randoms, trigger on DCRC3pB threshold 10. Start series with the Start Button. |
| note: I'm including in-run randoms now. I thought I noticed a couple series ago that breakdown noise improved over time. We should look at noise width in later randoms and compare to initial randoms. | |
| 1255 | Goldman = 42.0 mK |
| 1335 | Dial HV down to 0V after data series ends |
Analysis notes:
- noise width: 10.2 eV for first series of Side2 100V with source at y=0. Significantly worse. But the hot Al-flash after the move may not have been hot enough.
- noise width: 8.1 eV for second series of Side2 100V, after another flash.
- noise width: 5.53 eV for Side2 100V with source y=0, now with bias points lower in transition (dP/dI ~ 0.9 uV rather than 1.0 uV)
- noise width: 4.70(2)/4.65(4) eV for Side2 100V with source y=0, even lower in transition (dP/dI = 0.7 uV). Second value is in-run randoms, slightly different but not significant.
- noise width: 4.80(6)/4.49(5) eV for first/second half of series. This looks like a significant difference; noise seems to get better over time.