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2016/09/25 (Sunday Funday)

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DCRC1 and DCRC3 powered on and connected through HV setup EBoxDIB 2/3 → 3.2 MHz filters → Cables → remapping board I/remapping board II → HVside2board “DIB1”/“DIB2” → DCRC55(1)/50(3). Remapping boards have all possible lines switched off. 33kΩ resistor currently removed.
1202 10 hour UV bake ended around 1025, and detector had cooled to 82mK by 11:24. Fill LN2 coldtrap full.
1205 Put 33kΩ resistor back in place. Check that pulses are seen. Resume bias sweep with resistor and correct tracelength. Note that Ba source is not being used (we couldn't see peak).
1214 Manually start 15 min background data series at HV = -7V, DCRC1/Readout= 7V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1230 Cease data tests. Ground detector, flash with UV LEDs for 30s, then cool down for 10 minutes.
1241 Manually start 15 min background data series at HV = 6V, DCRC1/Readout= -6V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1301 Manually start 15 min background data series at HV = -6V, DCRC1/Readout= 6V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1316 Calculate data rate without Na-22 source: get 315 events/sec.
1320 Cease data tests. Ground detector, flash with UV LEDs for 30s, then cool down for 10 minutes.
1412 Pulses looked really noisey for some reason with Na-22 present after flash. Put source away and flash/cooldown again. Look at pulses and they appear good. Bring Na-22 source back out and they still look good. Not sure why it was so noisey for a bit. Calculate data rate with Na-22 source: 390 events/sec. Start another UV flash. and 10 minute cooldown.
1423 Manually start 15 min background data series at HV = 4V, DCRC1/Readout= -4V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1440 Cease data tests. Ground detector, flash with UV LEDs for 30s, then cool down for 10 minutes.
1452 Manually start 15 min background data series at HV = -4V, DCRC1/Readout= 4V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1516 Commence LHe transfer (32.5%). Put away Na-22 source and bring out Y-88 source.
1605 End LHe transfer (94.2%).
1606 Ground detector, flash with UV LEDs for 30s, then cool down for 10 minutes.
1610 Release pressure from main bath.
1615 Put Y-88 source away.
1617 Manually start 15 min background data series at HV = 2V, DCRC1/Readout= -2V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1635 Cease data tests. Ground detector, flash with UV LEDs for 30s, then cool down for 10 minutes.
1646 Release pressure from main bath.
1647 Manually start 15 min background data series at HV = -2V, DCRC1/Readout= 2V, with 1000 initial randoms, 1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1709 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ +12V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1717 Leave with G1/G2 = 191 mbar / 182 mbar, P1= 0.1 mbar, 1K Pot = 1.58 K / 8.5 mbar, and tower temperature at 99 mK (cooling from flash). Fill LN2 cold trap full.
1805 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ -12V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1834 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ 11V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1911 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ -11V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
1938 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ 9V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2008 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ -9V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2036 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ 7V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2106 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ -7V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2134 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ 5V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2203 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ -5V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2233 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ 3V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2301 With 33kΩ resistor on DIB1 QOFB line, commence automated series of 30 sec flash with UV LEDs/10 minute cooldown/15 minutes data with 0V HV/ -3V DIB1 and 1000 starting/1000 ending randoms with 150 ADC Bin trigger threshold on DIB1 Qo.
2328 Commence 10 hour UV bake. Start tomorrow off with consecutive series of the same voltage with UV flash in between.

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